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An analysis of the ceiling height requirement for a large-scale semiconductor fab

dc.citation.epage3706en_US
dc.citation.issue12en_US
dc.citation.spage3697en_US
dc.citation.volume48en_US
dc.citation.woscount0
dc.contributor.authorWu, Muh-Cherngen_US
dc.contributor.authorShih, Chang-Fuen_US
dc.contributor.authorChen, Chen-Fuen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:08:00Z
dc.date.available2014-12-08T15:08:00Z
dc.date.issued2010en_US
dc.description.abstractThis paper proposes the proposition that the fab ceiling height may become a bottleneck for throughput in a large-scale semiconductor fab. To justify the proposition, we propose a systematic approach for the design of the fab ceiling height. In this approach, we develop a queuing network model to evaluate the cycle time performance of a fab design under a target throughput. This queuing network model is adapted from Connor et al. [1996. A queueing network model for semiconductor manufacturing. IEEE Transactions on Semiconductor Manufacturing, 9 (3), 412-427] by additionally treating the transportation facilities as finite-capacity resources. Numerical experiments were carried out. The results indicate that a large-scale fab with an inappropriate ceiling height may limit the installation of transportation capacity, which, in turn, limits the utilisation of tool capacity, and thus lowers the fab throughput that can be achieved.en_US
dc.identifier.doi10.1080/00207540902814322en_US
dc.identifier.issn0020-7543en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF PRODUCTION RESEARCHen_US
dc.identifier.urihttp://dx.doi.org/10.1080/00207540902814322en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6281
dc.identifier.wosnumberWOS:000276471900017
dc.language.isoen_USen_US
dc.subjectproduction managementen_US
dc.subjectsemiconductor manufactureen_US
dc.titleAn analysis of the ceiling height requirement for a large-scale semiconductor faben_US
dc.typeArticleen_US

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