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Influence of phonon-associated tunneling rate on transport through a single-molecule transistor

dc.citation.epage92en_US
dc.citation.issue1en_US
dc.citation.spage87en_US
dc.citation.volume151en_US
dc.citation.woscount0
dc.contributor.authorTang, Ying-Tsanen_US
dc.contributor.authorChuu, Der-Sanen_US
dc.contributor.authorLin, Kao-Chinen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:38:05Z
dc.date.available2014-12-08T15:38:05Z
dc.date.issued2011-01-01en_US
dc.description.abstractWe study the electronic transport through a single-molecule transistor (SMT) by considering the phonon-associated tunneling rate We find that the electron-phonon interaction (EPI) changes the constant conductivities of the leads into a multi-channel structure of single vibration frequency This interference of the multi-channel tunneling process results in a bias-dependent tunneling rate and obscures the conductance peaks at large bias voltage The bias-dependent tunneling rate further causes a remarkable conductivity gap between the chemical potential of the leads (n = 0) and the first phonon sideband (n = 1) These anomalies are consistent with the experimental observations in transport experiments (C) 2010 Elsevier Ltd All rights reserveden_US
dc.identifier.doi10.1016/j.ssc.2010.10.007en_US
dc.identifier.issn0038-1098en_US
dc.identifier.journalSOLID STATE COMMUNICATIONSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.ssc.2010.10.007en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/26122
dc.identifier.wosnumberWOS:000285674000021
dc.language.isoen_USen_US
dc.subjectPhonon assisted tunnelingen_US
dc.subjectElectron-phonon interactionsen_US
dc.subjectElectronic transporten_US
dc.titleInfluence of phonon-associated tunneling rate on transport through a single-molecule transistoren_US
dc.typeArticleen_US

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