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Experimental electronic structure of Be2C

dc.citation.epage6843en_US
dc.citation.issue11en_US
dc.citation.spage6837en_US
dc.citation.volume58en_US
dc.citation.woscount16en_US
dc.contributor.authorTzeng, CTen_US
dc.contributor.authorTsuei, KDen_US
dc.contributor.authorLo, WSen_US
dc.contributor.department光電工程研究所zh_TW
dc.contributor.departmentInstitute of EO Enginerringen_US
dc.date.accessioned2019-04-03T06:39:21Z
dc.date.available2019-04-03T06:39:21Z
dc.date.issued1998-09-15en_US
dc.description.abstractThe insulating Be2C thin films have been successfully prepared on a Be surface. A low-energy electron diffraction pattern shows that the films have (100) orientation along the surface normal. We have used angle-resolved photoemission to map out the occupied bulk band dispersion along the T-X direction. The band-gap edges at the X point are 6.7 and 11.5 eV below the valence-band maximum, which is located at the Gamma point. These values are in good agreement with theoretical calculations. The unoccupied bulk electronic structure is measured using C Is near-edge x-ray-absorption spectroscopy. The spectrum is similar in shape to the energy-loss spectrum and the calculated p-partial density of states, while the peak positions are different.en_US
dc.identifier.doi10.1103/PhysRevB.58.6837en_US
dc.identifier.issn1098-0121en_US
dc.identifier.journalPHYSICAL REVIEW Ben_US
dc.identifier.urihttp://dx.doi.org/10.1103/PhysRevB.58.6837en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/32391
dc.identifier.wosnumberWOS:000076058800037en_US
dc.language.isoen_USen_US
dc.titleExperimental electronic structure of Be2Cen_US
dc.typeArticleen_US

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