Estimation of the Gilbert model parameters using the simulated annealing method
| dc.citation.epage | 1258 | en_US |
| dc.citation.issue | 14 | en_US |
| dc.citation.spage | 1256 | en_US |
| dc.citation.volume | 32 | en_US |
| dc.citation.woscount | 3 | |
| dc.contributor.author | Tan, TH | en_US |
| dc.contributor.author | Chang, WW | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電信工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Communications Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:02:30Z | |
| dc.date.available | 2014-12-08T15:02:30Z | |
| dc.date.issued | 1996-07-04 | en_US |
| dc.description.abstract | An estimation method based on the simulated annealing algorithm is proposed for computing the Gilbert model parameters from sample error sequences. Experimental results indicate that the simulated annealing method yields estimates which more closely match the experimental error statistics. | en_US |
| dc.identifier.issn | 0013-5194 | en_US |
| dc.identifier.journal | ELECTRONICS LETTERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/1170 | |
| dc.identifier.wosnumber | WOS:A1996UZ51000010 | |
| dc.language.iso | en_US | en_US |
| dc.subject | simulated annealing | en_US |
| dc.subject | error statistics | en_US |
| dc.title | Estimation of the Gilbert model parameters using the simulated annealing method | en_US |
| dc.type | Article | en_US |