THE VIBRATIONAL-MODE SOFTENING IN THIN-FILM CDS

dc.citation.epage	389	en_US
dc.citation.issue	5	en_US
dc.citation.spage	387	en_US
dc.citation.volume	81	en_US
dc.citation.woscount	8
dc.contributor.author	DAI, CM	en_US
dc.contributor.author	CHUU, DS	en_US
dc.contributor.department	電子物理學系	zh_TW
dc.contributor.department	Department of Electrophysics	en_US
dc.date.accessioned	2014-12-08T15:05:00Z
dc.date.available	2014-12-08T15:05:00Z
dc.date.issued	1992-02-01	en_US
dc.description.abstract	Lattice softening of the CdS LO phonon mode was observed by resonant Raman spectroscopy (RRS). This phenomenon was interpreted in terms of the combined effects of grain size and low-dimensionality of the film. As the thickness of the film decreases below 800 angstrom, the influence of the free-surface on the vibrational spectrum becomes more prominent. Higher order harmonics of the LO-mode also are observed. The intensity of the Raman line is enhanced as it approaches the maximum of the fluorescence emission peak.	en_US
dc.identifier.issn	0038-1098	en_US
dc.identifier.journal	SOLID STATE COMMUNICATIONS	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/3523
dc.identifier.wosnumber	WOS:A1992HF93400005
dc.language.iso	en_US	en_US
dc.title	THE VIBRATIONAL-MODE SOFTENING IN THIN-FILM CDS	en_US
dc.type	Article	en_US

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