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Direct Observation of Dual-Filament Switching Behaviors in Ta2O5-Based Memristors

dc.citation.volume13en_US
dc.contributor.authorChang, Chia-Fuen_US
dc.contributor.authorChen, Jui-Yuanen_US
dc.contributor.authorHuang, Chun-Weien_US
dc.contributor.authorChiu, Chung-Huaen_US
dc.contributor.authorLin, Ting-Yien_US
dc.contributor.authorYeh, Ping-Hungen_US
dc.contributor.authorWu, Wen-Weien_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2018-08-21T05:53:55Z
dc.date.available2018-08-21T05:53:55Z
dc.date.issued2017-04-18en_US
dc.identifier.doi10.1002/smll.201603116en_US
dc.identifier.issn1613-6810en_US
dc.identifier.journalSMALLen_US
dc.identifier.urihttp://dx.doi.org/10.1002/smll.201603116en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/145349
dc.identifier.wosnumberWOS:000399019700004en_US
dc.language.isoen_USen_US
dc.titleDirect Observation of Dual-Filament Switching Behaviors in Ta2O5-Based Memristorsen_US
dc.typeArticleen_US

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