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Deep electron trapping centers in Te-doped (AlxGa1-x)(0.5)In0.5P (x=0.5) layers grown by metal-organic chemical vapor deposition

dc.citation.epage3672en_US
dc.citation.issue6Aen_US
dc.citation.spage3671en_US
dc.citation.volume41en_US
dc.citation.woscount0
dc.contributor.authorSung, WJen_US
dc.contributor.authorHuang, KFen_US
dc.contributor.authorTseng, TYen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.date.accessioned2014-12-08T15:42:22Z
dc.date.available2014-12-08T15:42:22Z
dc.date.issued2002-06-01en_US
dc.description.abstractThe properties of deep electron trapping centers of Te-doped (AlxGa1-x)(0.5)In0.5P (x = 0.5) layers grown by metal-organic chemical vapor deposition (MOCVD) are studied by using deep level transient spectroscopy (DLTS) technique. One distinct deep electron trap located at 0.165 +/- 0.01 eV is observed and found to increase as elevating Te-dopant concentration in (AlxGa1-x)(0.5)In0.5P (,v = 0.5) materials, indicating that this deep electron trap is a donor-related defect and has the similar characters as deep levels observed in Si- and Se-doped (AlxGa1-x)(0.5)In0.5P.en_US
dc.identifier.doi10.1143/JJAP.41.3671en_US
dc.identifier.issn0021-4922en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERSen_US
dc.identifier.urihttp://dx.doi.org/10.1143/JJAP.41.3671en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/28771
dc.identifier.wosnumberWOS:000177169500011
dc.language.isoen_USen_US
dc.subjectAlGaInPen_US
dc.subjectTeen_US
dc.subjectdefecten_US
dc.subjectdeep levelen_US
dc.subjectdonor-related defecten_US
dc.subjectDLTSen_US
dc.titleDeep electron trapping centers in Te-doped (AlxGa1-x)(0.5)In0.5P (x=0.5) layers grown by metal-organic chemical vapor depositionen_US
dc.typeArticleen_US

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