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Separate Clock Network Voltage for Correcting Random Errors in ULV Clocked Storage Cells

dc.citation.epage951en_US
dc.citation.issue12en_US
dc.citation.spage947en_US
dc.citation.volume61en_US
dc.citation.woscount0en_US
dc.contributor.authorLuo, Shien-Chunen_US
dc.contributor.authorChang, Kuo-Chiangen_US
dc.contributor.authorChen, Ming-Pinen_US
dc.contributor.authorHuang, Ching-Jien_US
dc.contributor.authorChiu, Yi-Fangen_US
dc.contributor.authorChen, Po-Hsunen_US
dc.contributor.authorCheng, Liang-Chiaen_US
dc.contributor.authorLiu, Chih-Weien_US
dc.contributor.authorChu, Yuan-Huaen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2015-07-21T11:20:29Z
dc.date.available2015-07-21T11:20:29Z
dc.date.issued2014-12-01en_US
dc.description.abstractThis brief presents an implementation of ultralow-power microcontrollers that use a separate clock network voltage (SCNV) to correct unexpected errors produced by on-chip variations (OCVs). Separating the clock network voltage requires amendments in the standard cell library and physical designs. Here, the experiments used a 65-nm technology that exhibited considerable OCVs, which caused write and retention errors in clocked storage cells and limited the voltage scaling of microcontrollers. Using the SCNV provides an extraordinary operability to correct errors in the low-voltage clocked storage cells. In addition, the area overhead of the proposed implementation is negligible. Applying the SCNV, the measurement results indicate that the microcontrollers can be operated below 0.3 V, over 0.15-V extension in voltage scaling, and achieve the optimal energy consumption at 0.34 V. Separating the clock network voltage has tradeoff issues in system timing and energy consumption based on the measurement results, and this brief discusses proper applications.en_US
dc.identifier.doi10.1109/TCSII.2014.2356913en_US
dc.identifier.issn1549-7747en_US
dc.identifier.journalIEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/TCSII.2014.2356913en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/124114
dc.identifier.wosnumberWOS:000345852200008en_US
dc.language.isoen_USen_US
dc.subjectDigital clockingen_US
dc.subjectdynamic voltage scaling (DVS)en_US
dc.subjectflip-flopen_US
dc.subjectprocess variationen_US
dc.subjectsubthreshold circuiten_US
dc.titleSeparate Clock Network Voltage for Correcting Random Errors in ULV Clocked Storage Cellsen_US
dc.typeArticleen_US

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