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C-pm MPPAC for manufacturing quality control applied to precision voltage reference process

dc.citation.epage719en_US
dc.citation.issue9-10en_US
dc.citation.spage712en_US
dc.citation.volume23en_US
dc.citation.woscount2
dc.contributor.authorPearn, WLen_US
dc.contributor.authorShu, MHen_US
dc.contributor.authorHsu, BMen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:39:16Z
dc.date.available2014-12-08T15:39:16Z
dc.date.issued2004-05-01en_US
dc.description.abstractA multiprocess performance analysis chart (MPPAC), based on the process capability index C-pm, called C-pm MPPAC, is developed to analyse the manufacturing quality of a group of processes in a multiple process environment. The C-pm MPPAC conveys critical information about multiple processes regarding the departure of the process and process variability on one single chart. Existing research on MPPAC has been restricted to obtaining quality information from one single sample of each process, ignoring sampling errors. The information provided from the existing MPPAC chart, therefore, is unreliable and misleading, resulting in incorrect decisions. In this paper, the natural estimator of C(pm)is considered based on multiple samples. Based on the natural estimator of C-pm, sampling errors are considered by providing an explicit formula with Matlab to obtain the estimation accuracy of the C-pm. The sampling accuracy of C(pm)is tablulated for sample size determination so that engineers/practitioners can use it for in-plant applications. An example of multiple PVR processes is presented to illustrate the applicability of C-pm MPPAC for manufacturing quality control.en_US
dc.identifier.issn0268-3768en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGYen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/26819
dc.identifier.wosnumberWOS:000221468200012
dc.language.isoen_USen_US
dc.subjectmultiprocess performance analysis charten_US
dc.subjectmaximum likelihood estimatoren_US
dc.subjectprocess capability indexen_US
dc.subjectsample size determinationen_US
dc.titleC-pm MPPAC for manufacturing quality control applied to precision voltage reference processen_US
dc.typeArticleen_US

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