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半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究
半導體-絕緣體-半導體(SIS)異質接面結構應用於光檢測器製備之研究
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Date
2015
Authors
謝宗雍
HSIEH TSUNG-EONG
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https://www.grb.gov.tw/search/planDetail?id=11586381&docId=472785
https://ir.lib.nycu.edu.tw/handle/11536/129987
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