Skip to main content
Log In
Communities & Collections
All of DSpace
Statistics
Home
學術出版;;Publications
會議論文;;Conferences Paper
Invalid state identification for sequential circuit test generation
Invalid state identification for sequential circuit test generation
Loading...
Date
1996
Authors
Liang, HC
Lee, CL
Chen, JE
Journal Title
Journal ISSN
Volume Title
Publisher
DOI
Abstract
Description
Keywords
Citation
URI
https://ir.lib.nycu.edu.tw/handle/11536/19837
Collections
會議論文;;Conferences Paper
Endorsement
Review
Supplemented By
Referenced By
Full item page
