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Formation, Binding, and Stability of O-Ag-CO2-Ag-O Compounds on Ag(100) Investigated by Low Temperature Scanning Tunneling Microscopy and Manipulation

dc.citation.epage14179en_US
dc.citation.spage14173en_US
dc.citation.volume114en_US
dc.citation.woscount4en_US
dc.contributor.authorHsieh, Ming-Fengen_US
dc.contributor.authorLi, Hong-Doaen_US
dc.contributor.authorLin, Deng-Sungen_US
dc.contributor.authorMorgenstern, Karinaen_US
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentInstitute of Physicsen_US
dc.date.accessioned2019-04-02T05:57:56Z
dc.date.available2019-04-02T05:57:56Z
dc.date.issued2010-08-26en_US
dc.description.abstractThe understanding of reaction intermediates in heterogeneous catalysis has important implications for the design of novel catalysts. We investigate the adsorption of CO2 on oxygen precovered Ag(100) at low temperature (17 K) by scanning tunneling microscopy and inelastic electron tunneling manipulation at 5 K. On the terraces, the adsorption leads to O-Ag-CO2-Ag-O compounds with reduced binding of the oxygen to the surface as compared to the separately adsorbed molecules. The compound can be either dissociated into a bistable O-Ag-CO2 compound at 1.6 V, dissociated into its constituents at 2.2 V, or reacted at 6.5 V into a species, which we tentatively attribute to CO3. The thus obtained carbon trioxide or carbonate is an intriguing reaction intermediate, because it is not stable in the gas phase. Our detailed study of coadsorbed species outlines a possibility to investigate precursors of reactions that involve the substrate atoms.en_US
dc.identifier.doi10.1021/jp104170ben_US
dc.identifier.issn1932-7447en_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.identifier.urihttp://dx.doi.org/10.1021/jp104170ben_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/149996
dc.identifier.wosnumberWOS:000280961800029en_US
dc.language.isoen_USen_US
dc.titleFormation, Binding, and Stability of O-Ag-CO2-Ag-O Compounds on Ag(100) Investigated by Low Temperature Scanning Tunneling Microscopy and Manipulationen_US
dc.typeArticleen_US

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