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High quality factor nonpolar GaN photonic crystal nanocavities

dc.citation.epageen_US
dc.citation.issue19en_US
dc.citation.volume102en_US
dc.citation.woscount2
dc.contributor.authorWu, Tzeng-Tsongen_US
dc.contributor.authorLo, Sheng-Yunen_US
dc.contributor.authorHuang, Huei-Minen_US
dc.contributor.authorTsao, Che-Weien_US
dc.contributor.authorLu, Tien-Changen_US
dc.contributor.authorWang, Shing-Chungen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:31:32Z
dc.date.available2014-12-08T15:31:32Z
dc.date.issued2013-05-13en_US
dc.description.abstractHigh quality factor a-plane nonpolar GaN two-dimensional photonic crystal (PC) nanocavities on r-plane sapphire substrates have been demonstrated. Nonpolar GaN PC nanocavities on a thin membrane structure were realized by using e-beam lithography to define the PC patterns and focused-ion beam milling to fabricate the suspended thin membrane. A dominant resonant mode at 388 nm with a high quality factor of approximately 4300 has been demonstrated at 77K by the micro-photoluminescence system. Moreover, the degree of polarization of the emission from the non-polar GaN PC nanocavity was measured to be 64% along the m crystalline direction. (C) 2013 AIP Publishing LLC.en_US
dc.identifier.doi10.1063/1.4807137en_US
dc.identifier.issn0003-6951en_US
dc.identifier.journalAPPLIED PHYSICS LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.4807137en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/22362
dc.identifier.wosnumberWOS:000320440800016
dc.language.isoen_USen_US
dc.titleHigh quality factor nonpolar GaN photonic crystal nanocavitiesen_US
dc.typeArticleen_US

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