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TAYLOR-SERIES ANALYSIS AND IDENTIFICATION OF SCALED SYSTEMS

dc.citation.epage983en_US
dc.citation.issue5en_US
dc.citation.spage977en_US
dc.citation.volume18en_US
dc.citation.woscount0
dc.contributor.authorLEE, TTen_US
dc.contributor.authorTSAY, SCen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:04Z
dc.date.available2014-12-08T15:06:04Z
dc.date.issued1987-05-01en_US
dc.identifier.issn0020-7721en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF SYSTEMS SCIENCEen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4643
dc.identifier.wosnumberWOS:A1987H319900015
dc.language.isoen_USen_US
dc.titleTAYLOR-SERIES ANALYSIS AND IDENTIFICATION OF SCALED SYSTEMSen_US
dc.typeArticleen_US

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