Measuring manufacturing capability for couplers and wavelength division multiplexers
| dc.citation.epage | 541 | en_US |
| dc.citation.issue | 5-6 | en_US |
| dc.citation.spage | 533 | en_US |
| dc.citation.volume | 25 | en_US |
| dc.citation.woscount | 15 | |
| dc.contributor.author | Wu, CW | en_US |
| dc.contributor.author | Pearn, WL | en_US |
| dc.contributor.department | 工業工程與管理學系 | zh_TW |
| dc.contributor.department | Department of Industrial Engineering and Management | en_US |
| dc.date.accessioned | 2014-12-08T15:36:50Z | |
| dc.date.available | 2014-12-08T15:36:50Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.abstract | The couplers and wavelength division multiplexers have been widely used in high-speed, high-volume image data transmission systems to provide sufficient bandwidth and smaller channel spacing for greater throughput. In this paper, we develop a method for measuring the manufacturing capability of a process making couplers and wavelength division multiplexers. The proposed method measures the process capability of reproducing product items meeting the manufacturing specifications where multiple product quality characteristics are involved, including the polarization dependent loss, and the insertion loss, which are critical in fiber-optic transmission quality. | en_US |
| dc.identifier.doi | 10.1007/s00170-003-1793-9 | en_US |
| dc.identifier.issn | 0268-3768 | en_US |
| dc.identifier.journal | INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1007/s00170-003-1793-9 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/25233 | |
| dc.identifier.wosnumber | WOS:000227953900017 | |
| dc.language.iso | en_US | en_US |
| dc.subject | bootstrap methods | en_US |
| dc.subject | couplers | en_US |
| dc.subject | insertion loss | en_US |
| dc.subject | multiple characteristics | en_US |
| dc.subject | NCPPM | en_US |
| dc.subject | polarization dependent loss | en_US |
| dc.subject | process capability indices | en_US |
| dc.subject | wavelength division multiplexers | en_US |
| dc.subject | yield analysis | en_US |
| dc.title | Measuring manufacturing capability for couplers and wavelength division multiplexers | en_US |
| dc.type | Article | en_US |