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Phase-locked-loop-based delay-line-free picosecond electro-optic sampling system

dc.citation.epage2261en_US
dc.citation.issue4en_US
dc.citation.spage2255en_US
dc.citation.volume74en_US
dc.citation.woscount0
dc.contributor.authorLin, GRen_US
dc.contributor.authorChang, YCen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:41:10Z
dc.date.available2014-12-08T15:41:10Z
dc.date.issued2003-04-01en_US
dc.description.abstractA delay-line-free, high-speed electro-optic sampling (EOS) system is proposed by employing a delay-time-controlled ultrafast laser diode as the optical probe. Versatile optoelectronic delay-time controllers (ODTCs) based on modified voltage-controlled phase-locked-loop phase-shifting technologies are designed for the laser. The integration of the ODTC circuit and the pulsed laser diode has replaced the traditional optomechanical delay-line module used in the conventional EOS system. This design essentially prevents sampling distortion from misalignment of the probe beam, and overcomes the difficulty in sampling free-running high-speed transients. The maximum tuning range, error, scanning speed, tuning responsivity, and resolution of the ODTC are 3.9pi (700degrees), <5% deviation, 25-2405 ns/s, 0.557 ps/mV, and &SIM;1 ps, respectively. Free-running wave forms from the analog, digital, and pulsed microwave signals are sampled and compared with those measured by the commercial apparatus. (C) 2003 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.1536256en_US
dc.identifier.issn0034-6748en_US
dc.identifier.journalREVIEW OF SCIENTIFIC INSTRUMENTSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1536256en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/28016
dc.identifier.wosnumberWOS:000181829000001
dc.language.isoen_USen_US
dc.titlePhase-locked-loop-based delay-line-free picosecond electro-optic sampling systemen_US
dc.typeArticleen_US

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