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Three-dimensional simulation studies on electrostatic predictions for carbon nanotube field effect transistors (vol 177, pg 683, 2007)

dc.citation.epage794en_US
dc.citation.issue10en_US
dc.citation.spage794en_US
dc.citation.volume178en_US
dc.citation.woscount0
dc.contributor.authorChen, P. -Y.en_US
dc.contributor.authorShao, Y. -L.en_US
dc.contributor.authorCheng, K. -W.en_US
dc.contributor.authorHsu, K. -H.en_US
dc.contributor.authorWu, J. -S.en_US
dc.contributor.authorYu, J. -P.en_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.date.accessioned2014-12-08T15:12:10Z
dc.date.available2014-12-08T15:12:10Z
dc.date.issued2008-05-15en_US
dc.identifier.doi10.1016/j.cpc.2008.01.008en_US
dc.identifier.issn0010-4655en_US
dc.identifier.journalCOMPUTER PHYSICS COMMUNICATIONSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.cpc.2008.01.008en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/9332
dc.identifier.wosnumberWOS:000256733300008
dc.language.isoen_USen_US
dc.titleThree-dimensional simulation studies on electrostatic predictions for carbon nanotube field effect transistors (vol 177, pg 683, 2007)en_US
dc.typeCorrectionen_US

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