Three-intensity measurement technique and its measurement in elliptical retarder
| dc.citation.epage | 3406 | en_US |
| dc.citation.issue | 13 | en_US |
| dc.citation.spage | 3403 | en_US |
| dc.citation.volume | 281 | en_US |
| dc.citation.woscount | 5 | |
| dc.contributor.author | Lin, P. L. | en_US |
| dc.contributor.author | Han, C. Y. | en_US |
| dc.contributor.author | Chao, Y. F. | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:11:16Z | |
| dc.date.available | 2014-12-08T15:11:16Z | |
| dc.date.issued | 2008-07-01 | en_US |
| dc.description.abstract | A three-intensity technique is applied in polarimetry for measuring the physical parameters of an elliptical retarder. In this study, quartz and mica quarter wave plates are distinguished by two models: linear retarder and elliptical retarder. By considering the twist nematic liquid crystal cell as an elliptical retarder, we are able to relate the effective optic axis to its rubbing direction and twist angle. All its physical parameters can be deduced from the model. (C) 2008 Elsevier B.V. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.optcom.2008.02.042 | en_US |
| dc.identifier.issn | 0030-4018 | en_US |
| dc.identifier.journal | OPTICS COMMUNICATIONS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.optcom.2008.02.042 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/8648 | |
| dc.identifier.wosnumber | WOS:000256573900002 | |
| dc.language.iso | en_US | en_US |
| dc.subject | elliptical retarder | en_US |
| dc.subject | TN-LC cell | en_US |
| dc.subject | polarimetry | en_US |
| dc.title | Three-intensity measurement technique and its measurement in elliptical retarder | en_US |
| dc.type | Article | en_US |