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Modeling and verification of the double frequency effect using a MEMS device

dc.citation.epage802en_US
dc.citation.issue8en_US
dc.citation.spage796en_US
dc.citation.volume12en_US
dc.citation.woscount1
dc.contributor.authorChiou, JCen_US
dc.contributor.authorLin, YJen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:16:19Z
dc.date.available2014-12-08T15:16:19Z
dc.date.issued2006-07-01en_US
dc.description.abstractThe derivation, verification, and implication of the nonlinear dynamic and frequency response of electrostatic actuator due to the double frequency effect (DFE) were reported in this study. In particular, an extra mode called half mode was observed and measured in various studies. However, a complete in-depth discussion of the effect was not reported in the past. In the present study, a second-order dynamical equation was adapted firstly to model the dynamic and frequency response of electrostatic actuator where typical harmonic input signal with a dc bias was used. Secondly, by solving the equation, complex waveform in dynamic response and an extra half mode in frequency response due to the double frequency effect can be observed and discussed. To verify the simulated result, an electrostatic driving device was fabricated using PolyMUMPS(C) process. Note that in frequency response, when dc bias is equal to the amplitude of ac signal, simulated and experimental results indicated that the amplitude of half mode was one-fourth of first mode.en_US
dc.identifier.doi10.1007/s00542-006-0168-1en_US
dc.identifier.issn0946-7076en_US
dc.identifier.journalMICROSYSTEM TECHNOLOGIES-MICRO-AND NANOSYSTEMS-INFORMATION STORAGE AND PROCESSING SYSTEMSen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s00542-006-0168-1en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/12094
dc.identifier.wosnumberWOS:000237856600013
dc.language.isoen_USen_US
dc.titleModeling and verification of the double frequency effect using a MEMS deviceen_US
dc.typeArticleen_US

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