Saturation of large nonresonant third and fifth order optical nonlinearities from ZnSe quantum dots in glass-matrix thin films
| dc.citation.epage | 1262 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 1258 | en_US |
| dc.citation.volume | 42 | en_US |
| dc.citation.woscount | 13 | |
| dc.contributor.author | Ker, YC | en_US |
| dc.contributor.author | Lin, JH | en_US |
| dc.contributor.author | Hsieh, WF | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:41:14Z | |
| dc.date.available | 2014-12-08T15:41:14Z | |
| dc.date.issued | 2003-03-01 | en_US |
| dc.description.abstract | Large nonresonant optical Kerr coefficient without apparent nonlinear absorption was obtained from ZnSe-doped glass thin films grown by pulsed laser deposition. A third nonlinear refractive index of +0.87 to 1.56 cm(2)/GW and fifth order of + 17.2 cm(4)/GW(2) were measured for a light beam having femtosecond pulsewidth with photon energy below one half bandgap using the Z-scan method. Besides the enhancement of the nonlinear refractive index results from the two-photon near resonance and quantum confinement effect, the intensity-induced saturation of nonlinear refractive index is explained by the quadratic optical Stark shift. | en_US |
| dc.identifier.issn | 0021-4922 | en_US |
| dc.identifier.journal | JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/28048 | |
| dc.identifier.wosnumber | WOS:000182276000028 | |
| dc.language.iso | en_US | en_US |
| dc.subject | Z-scan | en_US |
| dc.subject | quantum dot | en_US |
| dc.subject | ZnSe | en_US |
| dc.subject | nonlinear refractive index | en_US |
| dc.subject | optical Stark shift | en_US |
| dc.title | Saturation of large nonresonant third and fifth order optical nonlinearities from ZnSe quantum dots in glass-matrix thin films | en_US |
| dc.type | Article | en_US |