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Asymmetrical Write-Assist for Single-Ended SRAM Operation

dc.citation.epage104en_US
dc.citation.spage101en_US
dc.contributor.authorLin, Jihi-Yuen_US
dc.contributor.authorTu, Ming-Hsienen_US
dc.contributor.authorTsai, Ming-Chienen_US
dc.contributor.authorJou, Shyh-Jyeen_US
dc.contributor.authorChuang, Ching-Teen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:19:40Z
dc.date.available2014-12-08T15:19:40Z
dc.date.issued2009en_US
dc.description.abstractIn this paper, asymmetrical Write-assist cell virtual ground biasing and positive feedback sensing keeper schemes are proposed to improve the Read Static Noise Margin (RSNM), Write Margin (WM), and operation speed of a single-ended Read/Write 8T SRAM cell. A 4Kbit SRAM implemented in 90nm CMOS technology achieves 1uW/bit average power consumption at 6MHz, V(min) of 410mV at 6MHz, and 234MHz maximum operation frequency at 600mV.en_US
dc.identifier.isbn978-1-4244-5220-0en_US
dc.identifier.journalIEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/13978
dc.identifier.wosnumberWOS:000277503200020
dc.language.isoen_USen_US
dc.titleAsymmetrical Write-Assist for Single-Ended SRAM Operationen_US
dc.typeArticleen_US

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