Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration
| dc.citation.epage | 76 | en_US |
| dc.citation.issue | 1-3 | en_US |
| dc.citation.spage | 71 | en_US |
| dc.citation.volume | 498 | en_US |
| dc.citation.woscount | 5 | |
| dc.contributor.author | Lee, Yu Hsien | en_US |
| dc.contributor.author | Yabushita, Atsushi | en_US |
| dc.contributor.author | Hsu, Chain Shu | en_US |
| dc.contributor.author | Yang, Sheng Hsiung | en_US |
| dc.contributor.author | Iwakura, Izumi | en_US |
| dc.contributor.author | Luo, Chih Wei | en_US |
| dc.contributor.author | Wu, Kaung Hsiung | en_US |
| dc.contributor.author | Kobayashi, Takayoshi | en_US |
| dc.contributor.department | 照明與能源光電研究所 | zh_TW |
| dc.contributor.department | 電子物理學系 | zh_TW |
| dc.contributor.department | 應用化學系 | zh_TW |
| dc.contributor.department | Institute of Lighting and Energy Photonics | en_US |
| dc.contributor.department | Department of Electrophysics | en_US |
| dc.contributor.department | Department of Applied Chemistry | en_US |
| dc.date.accessioned | 2014-12-08T15:48:15Z | |
| dc.date.available | 2014-12-08T15:48:15Z | |
| dc.date.issued | 2010-09-30 | en_US |
| dc.description.abstract | Ultrafast pump-probe spectroscopy of poly(3-hexylthiophene) (P3HT) films was performed using a 9-fs laser and a broadband lock-in detection system. The fast geometrical relaxation (GR) time was attributed to the transition from a free exciton (FE) to form a bound polaron pair (BPP), and the time constant was estimated to be tau(GR) = 90 +/- 2 fs. The relaxation time constant of BPP was determined as tau(BPP) = 710 +/- 40 fs. The measurement of pump-power dependence enabled us to distinguish the defect trapping process of BPPs from other parallel decay processes and to determine the defect concentration of a P3HT thin film. (C) 2010 Elsevier B.V. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.cplett.2010.08.036 | en_US |
| dc.identifier.issn | 0009-2614 | en_US |
| dc.identifier.journal | CHEMICAL PHYSICS LETTERS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.cplett.2010.08.036 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/32168 | |
| dc.identifier.wosnumber | WOS:000282161800015 | |
| dc.language.iso | en_US | en_US |
| dc.title | Ultrafast relaxation dynamics of photoexcitations in poly(3-hexylthiophene) for the determination of the defect concentration | en_US |
| dc.type | Article | en_US |