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In Situ and Self-Restorable Injection-Locking Monitor by Integrated Photodiode for FPLD WDM Transmitter

dc.citation.epage83en_US
dc.citation.issue1en_US
dc.citation.spage76en_US
dc.citation.volume47en_US
dc.citation.woscount0
dc.contributor.authorLin, Gong-Ruen_US
dc.contributor.authorLiao, Yu-Shengen_US
dc.contributor.authorKuo, Hao-Chungen_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2014-12-08T15:38:05Z
dc.date.available2014-12-08T15:38:05Z
dc.date.issued2011-01-01en_US
dc.description.abstractA novel in situ self-restoration scheme to track real time the injection locking of a Fabry-Perot laser diode (FPLD) is demonstrated by a built-in integrated monitor photodiode (MPD). The variation in the received photocurrent of the integrated MPD was calculated by a microcontroller unit integrated with an analog-to-digital converter, which is employed to dynamically control the temperature of the FPLD via a thermal-electrical controller for wavelength stabilization. Such a scheme can be effectively implemented with a minimum amount of redundant network resources to achieve self-restoration within 50 s with Q factor >8.2 and side-mode suppression ratio >35 dB at 2.5 Gbit/s. The feasibility of the proposed self-restorable locker is suitable for most wavelength-locking FPLDs within high-speed wavelength-division multiplexing networks.en_US
dc.identifier.doi10.1109/JQE.2010.2049643en_US
dc.identifier.issn0018-9197en_US
dc.identifier.journalIEEE JOURNAL OF QUANTUM ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/JQE.2010.2049643en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/26125
dc.identifier.wosnumberWOS:000285841100001
dc.language.isoen_USen_US
dc.subjectAuto restorationen_US
dc.subjectFabry-Perot laser diodeen_US
dc.subjectinjection lockingen_US
dc.subjectmonitored photodiodeen_US
dc.subjectreal timeen_US
dc.titleIn Situ and Self-Restorable Injection-Locking Monitor by Integrated Photodiode for FPLD WDM Transmitteren_US
dc.typeArticleen_US

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