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金屬薄膜與矽晶以及絻緣層界面反應研究(II)

dc.contributor.author陳力俊en_US
dc.contributor.authorCHEN LIH-JUANNen_US
dc.contributor.department交通大學電子工程系zh_TW
dc.date.accessioned2014-12-13T10:48:01Z
dc.date.available2014-12-13T10:48:01Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2215-E009-008zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=542193&docId=99608en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/101215
dc.language.isozh_TWen_US
dc.subject金屬薄膜zh_TW
dc.subject矽zh_TW
dc.subject介電層zh_TW
dc.subjectMetal thin filmen_US
dc.subjectSiliconen_US
dc.subjectDielectric layeren_US
dc.title金屬薄膜與矽晶以及絻緣層界面反應研究(II)zh_TW
dc.titleInterfacial Reactions of Metal Thin Films on Silicon and Dielectric Layers (II)en_US
dc.typePlanen_US

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