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Two-stage trigger silicon-controller rectifier (SCR) for radio-frequency (RF) input and output protections in nanometer technologies

dc.citation.epage134en_US
dc.citation.issueen_US
dc.citation.volume74en_US
dc.citation.woscount0
dc.contributor.authorLee, Jian-Hsingen_US
dc.contributor.authorWu, Yi-Hsunen_US
dc.contributor.authorHuang, Shao-Changen_US
dc.contributor.authorLee, Yu-Hueien_US
dc.contributor.authorChen, Ke-Horngen_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:23:27Z
dc.date.available2014-12-08T15:23:27Z
dc.date.issued2012-08-01en_US
dc.description.abstractIn this paper, a two-stage trigger (TST) scheme is proposed to implement a low-capacitance and zero-ohm input resistance electrostatic-discharge (ESD) protection device for nanometer technology applications. Besides the main trigger device diode string, the output transistor can also be used as the trigger device. The dimension of the main trigger device can be reduced for minimizing its capacitance with the additional trigger device. Moreover, the output transistor can be as the driving device without any series resistor. This is because the diode string can help to prevent integrated circuits (ICs) from ESD damage before the primary ESD protection device turns on. (c) 2012 Elsevier Ltd. All rights reserved.en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/16425
dc.identifier.wosnumberWOS:000305728600023
dc.language.isoen_USen_US
dc.subjectDTSCRen_US
dc.subjectSSPen_US
dc.subjectTSDSen_US
dc.subjectTSTen_US
dc.subjectESDen_US
dc.subjectTLPen_US
dc.subjectV-t1en_US
dc.titleTwo-stage trigger silicon-controller rectifier (SCR) for radio-frequency (RF) input and output protections in nanometer technologiesen_US
dc.typeArticleen_US

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