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A simple analytical model to accurately predict self-resonance frequencies of on-silicon-chip inductors in TEM mode and eddy current mode

dc.citation.epage1231en_US
dc.citation.issue8en_US
dc.citation.spage1225en_US
dc.citation.volume52en_US
dc.citation.woscount0
dc.contributor.authorGuo, Jyh-Chyurnen_US
dc.contributor.authorTan, Teng-Yangen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:11:05Z
dc.date.available2014-12-08T15:11:05Z
dc.date.issued2008-08-01en_US
dc.description.abstractFor the first time, a simple analytical model in the form of explicit formulas was derived for on-silicon-chip inductors. This analytical model can accurately calculate self-resonance frequencies (f(SR)) in TEM mode and eddy current mode corresponding to very high and very low substrate resistivities (rho(Si)). Furthermore, this derived model can predict and explain the interesting result that f(SR) keeps nearly a constant independent of rho(Si) in TEM and eddy current modes but is critically determined by the inductance and parasitic capacitances. The simple model is useful in on-silicon-chip inductor design for increasing f(SR) under specified inductance target for broadband RF circuit design and applications. (C) 2008 Elsevier Ltd. All rights reserved.en_US
dc.identifier.doi10.1016/j.sse.2008.05.012en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.sse.2008.05.012en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/8500
dc.identifier.wosnumberWOS:000259130700019
dc.language.isoen_USen_US
dc.subjectinductoren_US
dc.subjectself-resonance frequencyen_US
dc.subjectTEM modeen_US
dc.subjecteddy current modeen_US
dc.subjectsubstrate resistivityen_US
dc.titleA simple analytical model to accurately predict self-resonance frequencies of on-silicon-chip inductors in TEM mode and eddy current modeen_US
dc.typeArticleen_US

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