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FABRICATION OF ZN-SI SCHOTTKY-BARRIER DIODE BY CONTROLLING SUBSTRATE TEMPERATURE DURING EVAPORATION

dc.citation.epage648en_US
dc.citation.issue5en_US
dc.citation.spage646en_US
dc.citation.volume16en_US
dc.contributor.authorCHANG, CYen_US
dc.contributor.authorCHIU, PLen_US
dc.contributor.authorMA, CHen_US
dc.contributor.department工學院zh_TW
dc.contributor.departmentCollege of Engineeringen_US
dc.date.accessioned2014-12-08T15:07:13Z
dc.date.available2014-12-08T15:07:13Z
dc.date.issued1973-01-01en_US
dc.description.abstracten_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/5697
dc.language.isoen_USen_US
dc.titleFABRICATION OF ZN-SI SCHOTTKY-BARRIER DIODE BY CONTROLLING SUBSTRATE TEMPERATURE DURING EVAPORATIONen_US
dc.typeNoteen_US

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