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CROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPE STUDY OF THE GROWTH-KINETICS OF HEXAGONAL MOSI2 ON (001)SI

dc.citation.epage2223en_US
dc.citation.issue6en_US
dc.citation.spage2218en_US
dc.citation.volume61en_US
dc.citation.woscount39
dc.contributor.authorCHENG, JYen_US
dc.contributor.authorCHENG, HCen_US
dc.contributor.authorCHEN, LJen_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:06:05Z
dc.date.available2014-12-08T15:06:05Z
dc.date.issued1987-03-15en_US
dc.identifier.doi10.1063/1.337982en_US
dc.identifier.issn0021-8979en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.337982en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/4658
dc.identifier.wosnumberWOS:A1987G327200017
dc.language.isoen_USen_US
dc.titleCROSS-SECTIONAL TRANSMISSION ELECTRON-MICROSCOPE STUDY OF THE GROWTH-KINETICS OF HEXAGONAL MOSI2 ON (001)SIen_US
dc.typeArticleen_US

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