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DESIGN OF IMPROVED FAILURE DETECTION EXPERIMENTS IN SYNCHRONOUS SEQUENTIAL-MACHINES BASED ON TERMINAL MEASUREMENTS

dc.citation.epage297en_US
dc.citation.issue4en_US
dc.citation.spage293en_US
dc.citation.volume6en_US
dc.citation.woscount2
dc.contributor.authorDAS, SRen_US
dc.contributor.authorCHEN, Zen_US
dc.contributor.authorWU, SMen_US
dc.contributor.authorLEE, SYen_US
dc.contributor.authorBHATTACHARYYA, Aen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department資訊工程學系zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Computer Scienceen_US
dc.date.accessioned2014-12-08T15:06:31Z
dc.date.available2014-12-08T15:06:31Z
dc.date.issued1979en_US
dc.identifier.issn0045-7906en_US
dc.identifier.journalCOMPUTERS & ELECTRICAL ENGINEERINGen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/5080
dc.identifier.wosnumberWOS:A1979HX77800008
dc.language.isoen_USen_US
dc.titleDESIGN OF IMPROVED FAILURE DETECTION EXPERIMENTS IN SYNCHRONOUS SEQUENTIAL-MACHINES BASED ON TERMINAL MEASUREMENTSen_US
dc.typeArticleen_US

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