Thickness dependence of refractive index for anodic aluminium oxide films
| dc.citation.epage | 178 | en_US |
| dc.citation.issue | 2 | en_US |
| dc.citation.spage | 174 | en_US |
| dc.citation.volume | 16 | en_US |
| dc.citation.woscount | 8 | |
| dc.contributor.author | Chiu, RL | en_US |
| dc.contributor.author | Chang, PH | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:02:04Z | |
| dc.date.available | 2014-12-08T15:02:04Z | |
| dc.date.issued | 1997-01-15 | en_US |
| dc.identifier.issn | 0261-8028 | en_US |
| dc.identifier.journal | JOURNAL OF MATERIALS SCIENCE LETTERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/777 | |
| dc.identifier.wosnumber | WOS:A1997WE27400025 | |
| dc.language.iso | en_US | en_US |
| dc.title | Thickness dependence of refractive index for anodic aluminium oxide films | en_US |
| dc.type | Article | en_US |