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POWER LOSSES AND OPTIMUM OPERATION CONDITIONS OF SILICON QUASI-READ DIODES

dc.citation.epage626en_US
dc.citation.issue6en_US
dc.citation.spage621en_US
dc.citation.volume23en_US
dc.citation.woscount0
dc.contributor.authorCHANG, MCen_US
dc.contributor.authorCHEN, MCen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.date.accessioned2014-12-08T15:06:30Z
dc.date.available2014-12-08T15:06:30Z
dc.date.issued1980en_US
dc.identifier.issn0038-1101en_US
dc.identifier.journalSOLID-STATE ELECTRONICSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/5071
dc.identifier.wosnumberWOS:A1980JZ72300013
dc.language.isoen_USen_US
dc.titlePOWER LOSSES AND OPTIMUM OPERATION CONDITIONS OF SILICON QUASI-READ DIODESen_US
dc.typeArticleen_US

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