THE EFFECT OF APPLIED FREQUENCIES AND MULTIPLE FIRING ON THE RESISTANCE OF THICK-FILM RESISTORS
| dc.citation.epage | 396 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 393 | en_US |
| dc.citation.volume | 15 | en_US |
| dc.citation.woscount | 7 | |
| dc.contributor.author | CHIOU, BS | en_US |
| dc.contributor.author | HSU, WY | en_US |
| dc.contributor.author | DUH, JG | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2014-12-08T15:04:53Z | |
| dc.date.available | 2014-12-08T15:04:53Z | |
| dc.date.issued | 1992-06-01 | en_US |
| dc.description.abstract | The resistance and impedance as a function of frequency for Dupont 1600 series thick film resistors are investigated. There exists an abrupt decrease in the resistance around 1 MHz. An equivalent circuit model is proposed to explain the high frequency behavior in the resistor. After multiple times of firing, the resistance is altered and the relative change is related to the intrinsic-resistance in the resistor. It is argued that the resistance variation is associated with the microstructure evolution of the resistor, in which the rearrangement of conducting grains in the glass matrix plays a major role. | en_US |
| dc.identifier.issn | 0148-6411 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/3406 | |
| dc.identifier.wosnumber | WOS:A1992JF02900019 | |
| dc.language.iso | en_US | en_US |
| dc.title | THE EFFECT OF APPLIED FREQUENCIES AND MULTIPLE FIRING ON THE RESISTANCE OF THICK-FILM RESISTORS | en_US |
| dc.type | Article | en_US |