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氮化鋁疏水薄膜結構與製造方法及其在有機薄膜電晶體之應用

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber200839392zh_TW
dc.contributor.author顏國錫en_US
dc.contributor.author冉曉雯en_US
dc.contributor.author黃振昌en_US
dc.contributor.author陳建勳en_US
dc.contributor.author葉峻銘en_US
dc.contributor.author劉薄寬en_US
dc.contributor.author古國欣en_US
dc.date.accessioned2014-12-16T06:12:59Z
dc.date.available2014-12-16T06:12:59Z
dc.date.issued2008-10-01en_US
dc.description.abstract一種氮化鋁疏水薄膜結構與製造方法及其在有機薄膜電晶體之應用,乃提出具有高疏水性的氮化鋁薄膜,其具有高的水滴接觸角以及低的表面能,而利於成長疏水性薄膜,構成良好匹配之氮化鋁疏水薄膜結構,並適合作為有機薄膜電晶體的閘極介電層,以降低疏水性有機半導體薄膜與氧化鋁薄膜之間的介面缺陷,且兼具低閘極漏電及高介電係數等特質。zh_TW
dc.identifier.govdocG02F001/136zh_TW
dc.identifier.govdocH01L029/786zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/103951
dc.language.isozh_TWen_US
dc.title氮化鋁疏水薄膜結構與製造方法及其在有機薄膜電晶體之應用zh_TW
dc.typePatentsen_US

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