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Electric Field Effects on Photoluminescence of Polyfluorene Thin Films: Dependence on Excitation Wavelength, Field Strength, and Temperature

dc.citation.epage11915en_US
dc.citation.issue27en_US
dc.citation.spage11907en_US
dc.citation.volume113en_US
dc.citation.woscount11
dc.contributor.authorMehata, Mohan Singhen_US
dc.contributor.authorHsu, Chain-Shuen_US
dc.contributor.authorLee, Yuan-Pernen_US
dc.contributor.authorOhta, Nobuhiroen_US
dc.contributor.department應用化學系zh_TW
dc.contributor.departmentDepartment of Applied Chemistryen_US
dc.date.accessioned2014-12-08T15:09:09Z
dc.date.available2014-12-08T15:09:09Z
dc.date.issued2009-07-09en_US
dc.description.abstractElectroabsorption (E-A) and electrophotoluminescence (E-F) spectra of thin films of blue-light-emitting poly(9,9-dioctylfluorene) (PFO) have been measured at temperatures ranging from 25 to 295 K to examine both the optical property and excitation dynamics of these films in the presence of external electric fields of 0-1.2 MV cm(-1). Electric field effects on excitation dynamics depend on not only applied field strength but also excitation wavelength and temperature. For photoexcitation at 344 or 402 nm, E-F spectra observed with low applied fields show only the Stark shift, whereas fluorescence quenching is induced only by strong electric fields. For photoexcitation at a shorter wavelength of 298 nm, on the other hand, field-induced quenching of fluorescence is observed even with a weak electric field at any temperature. The presence of a nonradiative process from highly excited states that is effectively affected by electric fields is suggested.en_US
dc.identifier.doi10.1021/jp9023052en_US
dc.identifier.issn1932-7447en_US
dc.identifier.journalJOURNAL OF PHYSICAL CHEMISTRY Cen_US
dc.identifier.urihttp://dx.doi.org/10.1021/jp9023052en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6975
dc.identifier.wosnumberWOS:000267694900065
dc.language.isoen_USen_US
dc.titleElectric Field Effects on Photoluminescence of Polyfluorene Thin Films: Dependence on Excitation Wavelength, Field Strength, and Temperatureen_US
dc.typeArticleen_US

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