Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging
| dc.citation.epage | + | en_US |
| dc.citation.issue | 21 | en_US |
| dc.citation.spage | 2474 | en_US |
| dc.citation.volume | 23 | en_US |
| dc.citation.woscount | 33 | |
| dc.contributor.author | Chang, Hye Jung | en_US |
| dc.contributor.author | Kalinin, Sergei V. | en_US |
| dc.contributor.author | Morozovska, Anna N. | en_US |
| dc.contributor.author | Huijben, Mark | en_US |
| dc.contributor.author | Chu, Ying-Hao | en_US |
| dc.contributor.author | Yu, Pu | en_US |
| dc.contributor.author | Ramesh, Ramamoorthy | en_US |
| dc.contributor.author | Eliseev, Evgeny A. | en_US |
| dc.contributor.author | Svechnikov, George S. | en_US |
| dc.contributor.author | Pennycook, Stephen J. | en_US |
| dc.contributor.author | Borisevich, Albina Y. | en_US |
| dc.contributor.department | 材料科學與工程學系 | zh_TW |
| dc.contributor.department | Department of Materials Science and Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:32:26Z | |
| dc.date.available | 2014-12-08T15:32:26Z | |
| dc.date.issued | 2011-06-03 | en_US |
| dc.description.abstract | Direct atomic displacement mapping at ferroelectric interfaces by aberration corrected scanning transmission electron microscopy (STEM) (a-STEM image, b-corresponding displacement profile) is combined with the Landau-Ginsburg-Devonshire theory to obtain the complete interface electrostatics in real space, including separate estimates for the polarization and intrinsic interface charge contributions. | en_US |
| dc.identifier.doi | 10.1002/adma.201004641 | en_US |
| dc.identifier.issn | 0935-9648 | en_US |
| dc.identifier.journal | ADVANCED MATERIALS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1002/adma.201004641 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/22769 | |
| dc.identifier.wosnumber | WOS:000291732000013 | |
| dc.language.iso | en_US | en_US |
| dc.title | Atomically Resolved Mapping of Polarization and Electric Fields Across Ferroelectric/Oxide Interfaces by Z-contrast Imaging | en_US |
| dc.type | Article | en_US |