MULTIPLE FAULT DETECTION IN COMBINATIONAL CIRCUITS - ALGORITHMS AND COMPUTATIONAL RESULTS
| dc.citation.epage | 240 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 235 | en_US |
| dc.citation.volume | C 22 | en_US |
| dc.contributor.author | DU, MW | en_US |
| dc.contributor.author | WEISS, CD | en_US |
| dc.contributor.department | 工學院 | zh_TW |
| dc.contributor.department | College of Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:07:14Z | |
| dc.date.available | 2014-12-08T15:07:14Z | |
| dc.date.issued | 1973-01-01 | en_US |
| dc.description.abstract | en_US | |
| dc.identifier.issn | 0018-9340 | en_US |
| dc.identifier.journal | IEEE TRANSACTIONS ON COMPUTERS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/5699 | |
| dc.language.iso | en_US | en_US |
| dc.title | MULTIPLE FAULT DETECTION IN COMBINATIONAL CIRCUITS - ALGORITHMS AND COMPUTATIONAL RESULTS | en_US |
| dc.type | Article | en_US |
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