HIGH-TEMPERATURE THICK-FILM DIELECTRICS
| dc.citation.epage | 815 | en_US |
| dc.citation.issue | 6 | en_US |
| dc.citation.spage | 811 | en_US |
| dc.citation.volume | 63 | en_US |
| dc.citation.woscount | 4 | |
| dc.contributor.author | CHIOU, BS | en_US |
| dc.contributor.author | VEST, RW | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:06:15Z | |
| dc.date.available | 2014-12-08T15:06:15Z | |
| dc.date.issued | 1984 | en_US |
| dc.identifier.issn | 0002-7812 | en_US |
| dc.identifier.journal | AMERICAN CERAMIC SOCIETY BULLETIN | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4837 | |
| dc.identifier.wosnumber | WOS:A1984SX86100008 | |
| dc.language.iso | en_US | en_US |
| dc.title | HIGH-TEMPERATURE THICK-FILM DIELECTRICS | en_US |
| dc.type | Article | en_US |
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