Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels
| dc.citation.epage | 87 | en_US |
| dc.citation.spage | 83 | en_US |
| dc.citation.volume | 70 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Wang, Yao-Chin | en_US |
| dc.contributor.author | Lin, Bor-Shyh | en_US |
| dc.contributor.author | Chan, Ming-Che | en_US |
| dc.contributor.department | 光電系統研究所 | zh_TW |
| dc.contributor.department | 影像與生醫光電研究所 | zh_TW |
| dc.contributor.department | Institute of Photonic System | en_US |
| dc.contributor.department | Institute of Imaging and Biomedical Photonics | en_US |
| dc.date.accessioned | 2015-07-21T08:29:46Z | |
| dc.date.available | 2015-07-21T08:29:46Z | |
| dc.date.issued | 2015-06-01 | en_US |
| dc.description.abstract | The study proposed electro-optical measurement and process inspection for integrated-gate-driver circuit on thin-film-transistor array panel. It is a trend on the developing with application of integrated gate driver circuit in the narrow frame design and reduction of driver integrated circuit chips in thin-film-transistor array backplane. Over the past, it cannot detect that contain integrated-gate-driver circuit on thin-film-transistor array panel, especially in process defects of the integrated-gate-driver circuit. The paper proposed a process inspection for the defects in integrated-gate-driver circuit on the thin-film-transistor array panel by the voltage imaging technique and reported good performance. (C) 2015 Elsevier Ltd. All rights reserved. | en_US |
| dc.identifier.doi | 10.1016/j.measurement.2015.03.018 | en_US |
| dc.identifier.issn | 0263-2241 | en_US |
| dc.identifier.journal | MEASUREMENT | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1016/j.measurement.2015.03.018 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/124629 | |
| dc.identifier.wosnumber | WOS:000354402000009 | en_US |
| dc.language.iso | en_US | en_US |
| dc.subject | Electro-optical measurement | en_US |
| dc.subject | Integrated gate driver | en_US |
| dc.subject | TFT array panel | en_US |
| dc.title | Electro-optical measurement and process inspection for integrated gate driver circuit on thin-film-transistor array panels | en_US |
| dc.type | Article | en_US |
Files
License bundle
1 - 1 of 1
Loading...
- Name:
- license.txt
- Size:
- 1.71 KB
- Format:
- Item-specific license agreed to upon submission
- Description: