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Low-temperature sol-gel oxide TFT with a fluoropolymer dielectric to enhance the effective mobility at low operation voltage

dc.citation.volume56en_US
dc.contributor.authorYu, Shang-Yuen_US
dc.contributor.authorWang, Kuan-Hsunen_US
dc.contributor.authorZan, Hsiao-Wenen_US
dc.contributor.authorSoppera, Olivieren_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2018-08-21T05:53:19Z
dc.date.available2018-08-21T05:53:19Z
dc.date.issued2017-06-01en_US
dc.description.abstractIn this article, we propose a solution-processed high-performance amorphous indium-zinc oxide (a-IZO) thin-film transistor (TFT) gated with a fluoropolymer dielectric. Compared with a conventional IZO TFT with a silicon nitride dielectric, a fluoropolymer dielectric effectively reduces the operation voltage to less than 3V and greatly increases the effective mobility 40-fold. We suggest that the dipole layer formed at the dielectric surface facilitates electron accumulation and induces the electric double-layer effect. The dipole-induced hysteresis effect is also investigated. (C) 2017 The Japan Society of Applied Physicsen_US
dc.identifier.doi10.7567/JJAP.56.060303en_US
dc.identifier.issn0021-4922en_US
dc.identifier.journalJAPANESE JOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.7567/JJAP.56.060303en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/144537
dc.identifier.wosnumberWOS:000425237900001en_US
dc.language.isoen_USen_US
dc.titleLow-temperature sol-gel oxide TFT with a fluoropolymer dielectric to enhance the effective mobility at low operation voltageen_US
dc.typeArticleen_US

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