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Performance evaluation of a water mist system in semiconductor wet bench fires

dc.citation.epage218en_US
dc.citation.issueB3en_US
dc.citation.spage213en_US
dc.citation.volume86en_US
dc.citation.woscount1
dc.contributor.authorChang, Wen-Yaoen_US
dc.contributor.authorFu, Ping-Kunen_US
dc.contributor.authorChen, Chiun-Hsunen_US
dc.contributor.authorShu, Yi-Liangen_US
dc.contributor.department機械工程學系zh_TW
dc.contributor.departmentDepartment of Mechanical Engineeringen_US
dc.date.accessioned2014-12-08T15:12:12Z
dc.date.available2014-12-08T15:12:12Z
dc.date.issued2008-05-01en_US
dc.description.abstractWet benches are typically utilized in semiconductor facilities for wafer and parts cleaning. Heaters and some flammable liquids, such as acetone and isopropyl alcohol (IPA), are employed during the cleaning process. Wet bench fires have caused serious losses in the semiconductor industry. To assess the fire protection performance, several field tests were performed using a water mist system installed in the wet bench. In this study, acetone pan fuel was used as fire source. The test parameters were operational pressure, pan size, nozzle location, cylinder obstruction and degree of door closure. An appropriate design for operating pressure and the location of water mist nozzles extinguished wet bench fires effectively in the early fire stages. The nozzles are suggested to be fixed above or on the each side of the pan, ensuring that mist can completely cover a pan surface with sufficient momentum. With this suggested design, fires can be extinguished in the pan and do not spread over the wet bench. (c) 2007 The Institution of Chemical Engineers. Published by Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.psep.2007.10.013en_US
dc.identifier.issn0957-5820en_US
dc.identifier.journalPROCESS SAFETY AND ENVIRONMENTAL PROTECTIONen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.psep.2007.10.013en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/9358
dc.identifier.wosnumberWOS:000256411200008
dc.language.isoen_USen_US
dc.subjectwater misten_US
dc.subjectwet benchen_US
dc.subjectsemiconductoren_US
dc.subjectfireen_US
dc.titlePerformance evaluation of a water mist system in semiconductor wet bench firesen_US
dc.typeArticleen_US

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