超大型積體電路之測試與可測性設計
| dc.contributor.author | 李崇仁 | en_US |
| dc.contributor.department | 交通大學電子工程系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:51:26Z | |
| dc.date.available | 2014-12-13T10:51:26Z | |
| dc.date.issued | 2000 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC89-2215-E009-042 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=542238&docId=99619 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/102691 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 靜態電流測試 | zh_TW |
| dc.subject | 振盪環測試 | zh_TW |
| dc.subject | 數位測試 | zh_TW |
| dc.subject | 類比測試 | zh_TW |
| dc.subject | 非同步序向電路 | zh_TW |
| dc.subject | 運算放大器 | zh_TW |
| dc.subject | 內建式電流感測器 | zh_TW |
| dc.subject | 障礙模型 | zh_TW |
| dc.subject | IDDQ testing | en_US |
| dc.subject | Oscillating ring testing | en_US |
| dc.subject | Digital testing | en_US |
| dc.subject | Analog testing | en_US |
| dc.subject | Asynchronous sequential circuit | en_US |
| dc.subject | Operational amplifier | en_US |
| dc.subject | Built-in current sensor | en_US |
| dc.subject | Fault model | en_US |
| dc.title | 超大型積體電路之測試與可測性設計 | zh_TW |
| dc.title | VLSI Testing and Design for Testability | en_US |
| dc.type | Plan | en_US |