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Anisotropic electronic structure in single crystalline orthorhombic TbMnO3 thin films

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10.1016/j.tsf.2009.09.089

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We have deposited the c-axis-oriented orthorhombic TbMnO3 (o-TMO) films with well-aligned in-plane orientations on NdGaO3 (001) substrates by using pulsed laser deposition. The distinctive orientation alignments between the film and substrate allow the study of the X-ray absorption spectroscopy (XAS) with the electric field along three major crystallographic directions, respectively. Polarization-dependent XAS spectra show significant anisotropy in the electronic Structure of o-TMO. The correlation between the electronic structure, the bonding anisotropy, and the magnetoelectric effect in the multiferroic materials is revealed. (C) 2009 Elsevier B.V. All rights reserved.

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