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Design and analysis of digital data recovery circuits using oversampling

dc.citation.epage99en_US
dc.citation.issue1en_US
dc.citation.spage91en_US
dc.citation.volume1en_US
dc.citation.woscount0
dc.contributor.authorJou, S.-J.en_US
dc.contributor.authorLin, C.-H.en_US
dc.contributor.authorChen, Y.-H.en_US
dc.contributor.authorLi, Z.-H.en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:14:51Z
dc.date.available2014-12-08T15:14:51Z
dc.date.issued2007-02-01en_US
dc.description.abstractA performance evaluation and circuit architecture for all-digital data recovery using an oversampling method is proposed. The architecture is very regular and hence very suitable for standard-cell implementation flow. Due to its feedforward architecture, the required bit-rate can be achieved through proper pipelining. These properties make the proposed architecture very suitable as soft silicon intellectual property. Analysis of BER due to the combined effects of the key design parameters like data jitter, clock jitter and oversampling ratio in the oversampling technique are carried out. Thus different specifications of data recovery can be designed with different design parameters. A module generator that can estimate the design parameters automatically is established. Design implementation shows the proposed all-digital data recovery circuit can achieve 3.07 Gbit/s (post-layout) with 0.25 mu m 2.5 V CMOS technology standard-cell design and occupies 380 x 390 mu m(2) chip area.en_US
dc.identifier.issn1751-858Xen_US
dc.identifier.journalIET CIRCUITS DEVICES & SYSTEMSen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/11211
dc.identifier.wosnumberWOS:000246106200014
dc.language.isoen_USen_US
dc.titleDesign and analysis of digital data recovery circuits using oversamplingen_US
dc.typeArticleen_US

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