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A comparison of two methods for transforming non-normal manufacturing data

dc.citation.epage968en_US
dc.citation.issue9-10en_US
dc.citation.spage957en_US
dc.citation.volume31en_US
dc.citation.woscount3
dc.contributor.authorChung, S. H.en_US
dc.contributor.authorPearn, W. L.en_US
dc.contributor.authorYang, Y. S.en_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:15:01Z
dc.date.available2014-12-08T15:15:01Z
dc.date.issued2007-01-01en_US
dc.description.abstractMany statistical methods applied to manufacturing quality control and operations management have been under the assumption that the process characteristic investigated is normally distributed. If the process characteristic is not normally distributed, a popular approach is to transform the non-normal data into a normal one. In this paper, we consider the Box-Cox transformation, and compare the transformation power using two different parameter estimation methods, including the maximum likelihood estimator (MLE) and the method of percentiles (MOP). The performance comparison is based on the pass rate under the Shapiro-Wilk normality test. The results show that, in general, the MOP has better pass rate, while the MLE has smaller power variation for most cases investigated. For small sample size (n = 5, 10) both methods perform equally well. For large sample size, the MOP is recommended due to its simplicity and significantly higher pass rate.en_US
dc.identifier.doi10.1007/s00170-005-0279-3en_US
dc.identifier.issn0268-3768en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGYen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s00170-005-0279-3en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/11299
dc.identifier.wosnumberWOS:000244335300014
dc.language.isoen_USen_US
dc.subjectBox-Cox transformationen_US
dc.subjectnon-normal distributionen_US
dc.subjectparameter estimationen_US
dc.titleA comparison of two methods for transforming non-normal manufacturing dataen_US
dc.typeArticleen_US

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