High resolution central fringe identification
| dc.citation.epage | 4 | en_US |
| dc.citation.issue | 1-3 | en_US |
| dc.citation.spage | 1 | en_US |
| dc.citation.volume | 156 | en_US |
| dc.citation.woscount | 6 | |
| dc.contributor.author | Lee, JY | en_US |
| dc.contributor.author | Su, DC | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:47:25Z | |
| dc.date.available | 2014-12-08T15:47:25Z | |
| dc.date.issued | 1998-11-01 | en_US |
| dc.description.abstract | A high resolution central fringe identification by using the heterodyne interferometry with a tunable laser-diode and a fixed wavelength laser is presented. It can be operated easily and can be used to judge which arm of the Michelson interferometer is longer. The feasibility is demonstrated and it has 0.2 nm resolution. (C) 1998 Elsevier Science B.V. All rights reserved. | en_US |
| dc.identifier.issn | 0030-4018 | en_US |
| dc.identifier.journal | OPTICS COMMUNICATIONS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/31786 | |
| dc.identifier.wosnumber | WOS:000076960300001 | |
| dc.language.iso | en_US | en_US |
| dc.subject | central fringe | en_US |
| dc.subject | heterodyne interferometry | en_US |
| dc.title | High resolution central fringe identification | en_US |
| dc.type | Article | en_US |