Sliding mode control and stability analysis of buck DC-DC converter
| dc.citation.epage | 222 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 209 | en_US |
| dc.citation.volume | 94 | en_US |
| dc.citation.woscount | 12 | |
| dc.contributor.author | Tsai, J.-F. | en_US |
| dc.contributor.author | Chen, Y.-P. | en_US |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:14:57Z | |
| dc.date.available | 2014-12-08T15:14:57Z | |
| dc.date.issued | 2007 | en_US |
| dc.description.abstract | This paper is proposed to deal with the voltage regulation of buck DC-DC converter based on sliding mode control (SMC) technology. A buck DC-DC converter with parasitic resistance is inherently a bilinear system possessing inevitable uncertainties, such as variable resistive load and input disturbance. First, the buck DC-DC converter is modified into an uncertain linear model. Then, SMC technology is adopted to suppress the input disturbance and reduce the effects from the load variation. In addition, the continuous conduction mode (CCM) for normal operation can be guaranteed by the design of sliding function. Finally, experimental results are included for demonstration. | en_US |
| dc.identifier.doi | 10.1080/00207210601176692 | en_US |
| dc.identifier.issn | 0020-7217 | en_US |
| dc.identifier.journal | INTERNATIONAL JOURNAL OF ELECTRONICS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1080/00207210601176692 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/11241 | |
| dc.identifier.wosnumber | WOS:000246902900002 | |
| dc.language.iso | en_US | en_US |
| dc.subject | buck DC-DC converter | en_US |
| dc.subject | reaching and sliding region (RAS-region) | en_US |
| dc.subject | sliding mode control (SMC) | en_US |
| dc.subject | voltage regulation | en_US |
| dc.title | Sliding mode control and stability analysis of buck DC-DC converter | en_US |
| dc.type | Article | en_US |