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Unusual Morphological Evolution of the Cu Pillar/Solder Micro-joints During High-Temperature Annealing

dc.citation.epage1837en_US
dc.citation.spage1834en_US
dc.citation.volume46Aen_US
dc.citation.woscount0en_US
dc.contributor.authorCheng, Hsi-Kueien_US
dc.contributor.authorLin, Yu-Jieen_US
dc.contributor.authorChang, Hou-Chienen_US
dc.contributor.authorLiu, Kuo-Chioen_US
dc.contributor.authorWang, Ying-Langen_US
dc.contributor.authorLiu, Tzeng-Fengen_US
dc.contributor.authorChen, Chih-Mingen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.department照明與能源光電研究所zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.contributor.departmentInstitute of Lighting and Energy Photonicsen_US
dc.date.accessioned2015-07-21T08:29:25Z
dc.date.available2015-07-21T08:29:25Z
dc.date.issued2015-05-01en_US
dc.description.abstractThe morphological evolution of Cu pillars capped with Sn-1.8 wt pct Ag solder during high-temperature annealing was investigated. Two intermetallic compounds (Cu6Sn5 + Cu3Sn) formed at the Cu/solder interface which changed the pillar\'s morphology. Surface diffusion enhanced the growth of Cu6Sn5 + Cu3Sn around the pillar brim and transformed the pillar top from a plane into a truncated cone. Bulk diffusion dominated after long-term annealing and the pillar top became hemispherical shaped. A mechanism was proposed to explain the unusual morphological evolution. (C) The Minerals, Metals & Materials Society and ASM International 2015en_US
dc.identifier.doi10.1007/s11661-015-2825-4en_US
dc.identifier.issn1073-5623en_US
dc.identifier.journalMETALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCEen_US
dc.identifier.urihttp://dx.doi.org/10.1007/s11661-015-2825-4en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/124450
dc.identifier.wosnumberWOS:000351527200002en_US
dc.language.isoen_USen_US
dc.titleUnusual Morphological Evolution of the Cu Pillar/Solder Micro-joints During High-Temperature Annealingen_US
dc.typeArticleen_US

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