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2-V-operation delta-doped power HEMT's for personal handy-phone systems

dc.citation.epage221en_US
dc.citation.issue8en_US
dc.citation.spage219en_US
dc.citation.volume7en_US
dc.contributor.authorLai, YLen_US
dc.contributor.authorChang, EYen_US
dc.contributor.authorChang, CYen_US
dc.contributor.authorLiu, THen_US
dc.contributor.authorWang, SPen_US
dc.contributor.authorHsu, HTen_US
dc.contributor.department交大名義發表zh_TW
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentNational Chiao Tung Universityen_US
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:01:32Z
dc.date.available2014-12-08T15:01:32Z
dc.date.issued1997-08-01en_US
dc.description.abstractA high-efficiency and high-power-density delta-doped AIGaAs/InGaAs HEMT with low adjacent channel leakage has been developed for the digital wireless personal handy-phone system (PHS). When qualified by 1.9-GHz pi/4-shifted quadrature phase shift keying (QPSK) modulated PHS standard signals, the 2.0-V-operation HEMT with a 1-mm gate width demonstrated a power-added efficiency of 45.3% and an output power density of 105 mW/mm. This is the highest power density ever reported by the power transistors for the PHS. The state-of-the-art results for the PHS operating at 2.0 V were achieved by the delta-doped power HEMT for the first time.en_US
dc.identifier.doi10.1109/75.605483en_US
dc.identifier.issn1051-8207en_US
dc.identifier.journalIEEE MICROWAVE AND GUIDED WAVE LETTERSen_US
dc.identifier.urihttp://dx.doi.org/10.1109/75.605483en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/372
dc.language.isoen_USen_US
dc.title2-V-operation delta-doped power HEMT's for personal handy-phone systemsen_US
dc.typeArticleen_US

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