Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry
| dc.citation.epage | 3939 | en_US |
| dc.citation.issue | 17 | en_US |
| dc.citation.spage | 3935 | en_US |
| dc.citation.volume | 45 | en_US |
| dc.citation.woscount | 9 | |
| dc.contributor.author | Chao, YF | en_US |
| dc.contributor.author | Lee, KY | en_US |
| dc.contributor.author | Lin, YD | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2014-12-08T15:16:25Z | |
| dc.date.available | 2014-12-08T15:16:25Z | |
| dc.date.issued | 2006-06-10 | en_US |
| dc.description.abstract | The analytical solutions of the azimuthal deviation of a polarizer and an analyzer were obtained by polarizer-sample-analyzer ellipsometry with a three-intensity measurement technique. By performing two sets of this three-intensity measurement with the polarizer's azimuth set at 45 degrees and at -45 degrees, we were able to obtain a set of ellipsometric parameters free from the azimuthal deviations of the polarizer and the analyzer. (c) 2006 Optical Society of America. | en_US |
| dc.identifier.doi | 10.1364/AO.45.003935 | en_US |
| dc.identifier.issn | 0003-6935 | en_US |
| dc.identifier.journal | APPLIED OPTICS | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1364/AO.45.003935 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/12158 | |
| dc.identifier.wosnumber | WOS:000238199700002 | |
| dc.language.iso | en_US | en_US |
| dc.title | Analytical solutions of the azimuthal deviation of a polarizer and an analyzer by polarizer-sample-analyzer ellipsometry | en_US |
| dc.type | Article | en_US |