MY-BOX REPRESENTATION FOR FAULTY CMOS CIRCUITS
| dc.citation.epage | 232 | en_US |
| dc.citation.issue | 3 | en_US |
| dc.citation.spage | 225 | en_US |
| dc.citation.volume | 137 | en_US |
| dc.citation.woscount | 0 | |
| dc.contributor.author | CHEN, JE | en_US |
| dc.contributor.author | LEE, CL | en_US |
| dc.contributor.author | SHEN, WZ | en_US |
| dc.contributor.department | 交大名義發表 | zh_TW |
| dc.contributor.department | 電控工程研究所 | zh_TW |
| dc.contributor.department | National Chiao Tung University | en_US |
| dc.contributor.department | Institute of Electrical and Control Engineering | en_US |
| dc.date.accessioned | 2014-12-08T15:05:33Z | |
| dc.date.available | 2014-12-08T15:05:33Z | |
| dc.date.issued | 1990-06-01 | en_US |
| dc.identifier.issn | 0956-3768 | en_US |
| dc.identifier.journal | IEE PROCEEDINGS-G CIRCUITS DEVICES AND SYSTEMS | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/4097 | |
| dc.identifier.wosnumber | WOS:A1990DE42000007 | |
| dc.language.iso | en_US | en_US |
| dc.title | MY-BOX REPRESENTATION FOR FAULTY CMOS CIRCUITS | en_US |
| dc.type | Article | en_US |